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ESD/TLP
Low temperature magnetic field probe station
MPI probe station
Failure analysis equipment
Test Instrumentation
PCB test probe station
OKMETIC
Characteristic Characterizatio
Four - Probe Method for Measure
LIV Characteristic Test Schemel
IV and CV Characteristic Test
Semiconductor Hall Effect Test
Semiconductor Discrete Device
Existing test types: DC test, RF test, High voltage and high current test, photoelectric test, extremely low temperature magnetic field test, ESD/TLP test, PCB board level test, etc
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R&S®ZNB vector network analyzer
Keithley 4200A-SCS Parameter Analyzer
3 Series MDO Mixed Domain Oscilloscope
Keithley Parametric Test Systems
N5291A PNA Millimeter-wave System
Noise Parameters
Pulsed IV Systems
Vector-Receiver Load Pull Measurements
R&S®ZNA vector network analyzers
FS-Pro